Uno Data HubLoading feature usage metrics...
Summary
Feature Charts
- Discovery / Success / Failure bars are unique-user counts per feature in the selected timeframe.
- Reliability % labels are shown above each feature and represent success ratio for that feature.
- Inactive After Feature Usage shows the percent of users who became inactive after their feature-use event.
Note: Uno Platform Status Indicator reliability can appear as 0 or be under-represented when no outcome events are recorded in the selected timeframe. Success is tracked across IDEs via udei-action-clicked, but failure telemetry is currently documented as VSIX-only (uno/vs-vsix/udei-failure).
Discovery, Success, and Failure Users by Feature
Inactive After Feature Usage (30-day)
Feature Detail
| Feature | Discovery Users | Success Users | Failure Users | Reliability % |
|---|
Churn Correlation
- Risk Uplift = feature-specific churn rate minus global churn rate (percentage points).
- Impact Score combines uplift and audience size to highlight higher-priority opportunities.
Last Successful Feature Use Before 30-Day Inactivity
Each bar groups machines by their last successful feature-use event (per Feature Usage Definition), then measures 30-day inactivity risk and impact.
Note: only successful-use events defined in the feature usage definitions are considered. IDE Integration is excluded here because successful-use criteria are still marked TODO in the source definition.
No qualifying successful feature-use events found for this timeframe.